PDF) Single-electron transistor of a single organic molecule with access to several redox states
Single-molecule quantum-transport phenomena in break junctions | Nature Reviews Physics
Single-molecule transistors - Chemical Society Reviews (RSC Publishing) DOI:10.1039/C4CS00231H
New methods for understanding electromigration in sub-nanometer ICs - EDN
Transistor configuration yields energy level control in protein-based junctions - Nanoscale (RSC Publishing)
Characterization of nanoscale temperature fields during electromigration of nanowires | Scientific Reports
PDF) A microscopic view on acoustomigration
Electromigration in Gold Interconnects
PDF) A microscopic view on acoustomigration
PDF) Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization
PDF) Electromigration and the structure of metallic nanocontacts
PDF) Advances and challenges in single-molecule electron transport
Surface Electromigration and Current Crowding | SpringerLink
Electrostatic control of thermoelectricity in molecular junctions | Nature Nanotechnology
The role of titanium in electromigrated tunnel junctions: Applied Physics Letters: Vol 105, No 22
Electromigration - Wikipedia
Heat dissipation in quasi-ballistic single-atom contacts at room temperature | Scientific Reports
Effect of Sn crystallographic orientation on solder electromigration and Ni diffusion in Cu/Ni plating/Sn–0.7Cu joint at low current density | SpringerLink
Nanogap structures for molecular nanoelectronics | SpringerLink
Applied Sciences | Free Full-Text | Nanofabrication Techniques in Large-Area Molecular Electronic Devices | HTML
Quantum mechanical effects in plasmonic structures with subnanometre gaps | Nature Communications
PDF) | Working Paper | Advances and challenges in single-molecule electron transport
Single-electron transistor of a single organic molecule with access to several redox states | Nature
Nanogap Electrodes towards Solid State Single‐Molecule Transistors - Cui - 2015 - Small - Wiley Online Library
Electromigration-induced resistance switching in indented Al microstrips
